Used JEOL ARM200CF Super X #9274124 for sale

JEOL ARM200CF Super X Scanning Electron Microscope (SEM) is one of the most advanced scanning electron microscopes on the market today. It is ideal for applications in materials science, materials analysis, and medical research. The system offers high-resolution imaging up to 200kV, using a condenser lens, and allows for simultaneous connection of up to four sample holders. ARM200CF Super X SEM features a superior depth of focus (DOF) control mechanism to provide extended depth of field, keeping images within the plane of focus without the use of multiple imaging conditions. It also has a unique Field Emission Gun (FEG) technology which yields superior signal-to-noise ratio allowing for higher resolution imaging than traditional SEMs. The FEG technology also enables faster scanning for improved throughput. In addition, JEOL ARM200CF Super X SEM employs advanced secondary electron imaging (SEM PED) technology to limit contamination of the samples from the interface between the electron source and the specimen. The improved resolution and detail from this topography imaging method is enhanced by the use of secondary electron detection along with analytical techniques such as XEDS, ESP and Crystal Orientation Mapping. ARM200CF Super X SEM also provides an array of user-friendly features including automated wafer analysis and routine/semi-automatic programming as well as an autofocus system for sample positioning and exact operation. The superior performance and the user-friendly features of this SEM make it the perfect choice for demanding imaging applications.