Used JEOL ARM200CF Super X #9293905 for sale

JEOL ARM200CF Super X
ID: 9293905
Vintage: 2014
PFA System 2014 vintage.
JEOL ARM200CF is a high performance scanning electron microscope (SEM) designed with advanced analytical capabilities. It features a high resolution monolithic polysilicon CCD camera for high-sensitivity imaging along with a high intensity Schottky field emission gun (FEG) for high-resolution imaging. This electron microscope is capable of capturing highly-detailed images of even small specimens at extremely high levels of magnification. The ARM200CF is based on a variable pressure (VP) column and features the SuperX QuickScan imaging technology, which provides superior images with faster scanning speeds compared to other technologies. The column also utilizes a fast-driving scanner, offering better resolution, improved contrast, and faster processing for real-time imaging. The column design is based on an inverted optical system, allowing for low operating costs and improved scanning resolution. The ARM200CF also has a built-in automated sample stage for easy operation, featuring a temperature control for repeatable sample preparation for consistent results. The fast scanning speed and low running cost make this model ideal for high-throughput tasks, such as advanced metallography, material research, failure analysis, and dimensional measurement. The powerful imaging software also facilitates fast data collection with high-speed image acquisition and integration with laboratory software. The ARM200CF is also equipped with advanced imaging capabilities such as a secondary electron suppression filter (SESF), backscattered electron image (BSE), and diffraction contrast image (DCI). The SESF is used to detect low-contrast features and suppresses electrostatic fields, while the BSE image reveals surface features of the sample and the DCI image enhances crystal lattices. JEOL ARM200CF is a high-end and reliable electron microscope, offering superior performance and advanced analytical capabilities in one compact system. Its high-resolution imaging capabilities, fast scanning speeds, low running costs, and flexible sample stages make it ideal for a wide range of applications.
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