Used JEOL BX-MWC1002T93 #9282256 for sale

JEOL BX-MWC1002T93 is a dual beam scanning electron microscope (SEM) that offers a high quality, all-in-one equipment for chemistry and materials research applications. Its high resolution imaging capabilities provide researchers with detailed images of the structures of various materials. It has a magnification range of up to 150,000x, making it ideal for viewing minute details of samples. Its high performance features include an inverted electron optical column with a magnetically levitated stage for superior sample manipulation, a variable pressure scanning capability for creating optimal imaging conditions, and a resolution of up to 0.4 nanometers. Automation features help to ensure consistent results by optimizing imaging conditions for any sample from a wide range of materials. BX-MWC1002T93 is equipped with an advanced X-ray energy dispersive (XEDS) system for elemental analysis of samples. The unit allows users to identify and quantify the elemental composition of samples, as well as obtain detailed information on the structure of the sample at different magnifications. The SEM also integrates a high power electron optics which allows users to focus on different areas of the sample within the same field of view, making it an ideal choice for imaging complex features and structures. In addition, the machine features a patented nanofocusing tool that enables high-magnification imaging without degrading the quality of the image. The asset is easy to install and user-friendly, and includes a variety of imaging and analysis tools to customize according to individual needs. Furthermore, it includes smart and automated sample analysis for quick and easy data acquisition, even for difficult samples. Overall, JEOL BX-MWC1002T93 is an ideal scanning electron microscope for detailed studies of materials and their structures. Its features make it ideal not only for materials and chemistry research applications, but for biological and industrial applications as well. Its high resolution imaging capabilities allow users to observe the structure of materials at different magnifications, and its advanced analysis features provide detailed results of both micro and nanoscopic levels.