Used JEOL BX-WAC300B93 #9282276 for sale

JEOL BX-WAC300B93 Scanning Electron Microscope (SEM) is a high performance table-top SEM equipment that enables observation and analysis of a variety of materials in a wide range of environments. This model combines advanced electron optics with a 300kV accelerating voltage for reliable imaging of a variety of objects. It is capable of imaging to a resolution of 0.7 nm and can achieve magnifications of up to 100,000x, making it ideal for viewing small features on specimens. BX-WAC300B93 has a large selection of features enabling high-resolution imaging, such as a digital LCD monitor display, adjustable beam current, and variable pressure Cold Field Emission (CEF) electron optics. The CEF electron optics prevent unwanted particles from entering the column and cause contamination, giving better image clarity. JEOL BX-WAC300B93 also has a coarse and fine focus system for easier manipulation of the ultrafine beam current, allowing for more accurate analysis of samples. Additionally, the microscope has a motorized stigmator, which helps improve image resolution and enhances contrast. To provide further accuracy, BX-WAC300B93 has an automated background imaging unit, which can accurately analyze features in the background of the sample. JEOL BX-WAC300B93 is equipped with a unique stage control machine and can be used to image different specimens using a variety of techniques, including scanning electron microscopy (SEM), low voltage electron microscopy, and image magnification modes. Additionally, this tool includes various specimen holders, such as a TEM specimen holder, a stub holder, and an RBS holder. The stage control asset can also be used to move sections of the specimen and can be operated manually or automatically. Additionally, this model features an auto-focusing function for finer level analysis of the specimen. BX-WAC300B93 provides a wide range of sample preparation options for imaging, including mechanical polishing, sputter coating, cryo-and cold cooling techniques, and various other cleaning techniques. The microscope can be used to observe metal, inorganic, organic, and crystal samples with minimal sample preparation. In addition to its advanced imaging capabilities, JEOL BX-WAC300B93 also features several software packages for data collecting and analysis. These software packages include SEIMAGER software for particle analysis, ADELM software for differential contrast analysis, and CORCON software for automated signal processing. These programs enable operation and analysis of the microscope's data in an efficient manner. Furthermore, this microscope is equipped with a digital archive equipment, which enables users to save all images and data captured during an analysis session. BX-WAC300B93 Scanning Electron Microscope is a powerful, versatile analysis system that is ideal for examining a variety of materials and objects in a wide range of environments. Its advanced electron optics, combined with a host of automated features and software packages, ensure reliable and accurate imaging of both large and small objects. This model provides an excellent platform for the analysis of a range of samples, from metals to organic materials.