Used JEOL BZG-70CTSCLPL #9282274 for sale

JEOL BZG-70CTSCLPL is a scanning electron microscope (SEM) ideally suited for materials science and engineering applications. This SEM features ultra-high resolution imaging in a compact, user-friendly design with low maintenance requirements. BZG-70CTSCLPL has a high-brightness filamentless field emission gun (FEG) combined with an ultra-low vibration sample chamber for superior imaging. This configuration minimizes electron beam divergence while producing ultra-high resolution images. The variable pressure LED sample chamber enables variation of the electron beam current over a wide range, allowing for accurate mapping of sample features. JEOL BZG-70CTSCLPL comes with a large field of view and high overall performance. It has a wide working distance of 12.7 mm and an image resolution of 0.8 nm, making it perfect for imaging tiny features both in topography and chemical composition. It has low detective noise ratio and a minimum dynamic range of 1000:1, allowing users to detect small concentrations of the sample. BZG-70CTSCLPL is ideal for imaging delicate samples such as biomaterials, ceramics, polymers and nano-materials. It also works well for 3D reconstruction and has the ability to transfer data into higher-order file formats. High definition imaging is available with the high contrast and low noise level. JEOL BZG-70CTSCLPL is designed for operation in an automated environment. The sample stage can be automated to quickly achieve compensation for sample movement and repeatable location points. The system can be operated via Ethernet or bus interface to external computers while scans are running, allowing for different operations to be completed simultaneously. BZG-70CTSCLPL is a reliable scanning electron microscope with user-friendly features for analyzing materials with precision. Its low maintenance requirements, wide dynamic range of imaging, and low vacuum mode make it a perfect choice for applications that require exceptional imaging capability.