Used JEOL BZG-71CSTSCLPL #9282273 for sale

JEOL BZG-71CSTSCLPL scanning electron microscope (SEM) is designed for high-resolution imaging and analysis of both hard and soft materials. This advanced instrument uses an automated vacuum system to prepare the sample for observation and is equipped with a back-scattered electron detector, allowing the user to view both surface and internal structure. BZG-71CSTSCLPL also has an integrated environmental chamber, allowing the user to examine samples under controlled atmosphere and temperature conditions. The unit is equipped with a field emission gun (FEG), which enables JEOL BZG-71CSTSCLPL to reach resolutions of better than 10 nanometers, offering outstanding image detail and clarity. This high resolution paired with powerful digital signal processing (DSP) technology makes imaging thin and delicate samples possible. BZG-71CSTSCLPL also has an automated stage and XYZ motion control, allowing for repeatable imaging of the same sample in multiple directions. In terms of functionality, JEOL BZG-71CSTSCLPL offers a variety of imaging and analysis modes. This SEM is capable of both 2-D imaging and 3-D reconstruction using its 3D ZYX-based automated imaging system. For elemental analysis, the SEM incorporates a proton-assisted X-ray detector and an energy-dispersive X-ray spectroscopy (EDS) detector, allowing the user to determine the chemical composition of the sample. BZG-71CSTSCLPL is an impressive and user-friendly SEM that is ideal for use in diverse applications such as engineering, geology, material science, medical research and more. This highly efficient SEM offers an impressive combination of features that make it a top choice for imaging and analysis of many types of materials. With its advanced imaging capabilities and automated design, JEOL BZG-71CSTSCLPL is an ideal solution for diverse and demanding imaging needs.