Used JEOL BZG-72WCST8H #9282258 for sale

JEOL BZG-72WCST8H is a state-of-the-art scanning electron microscope (SEM) with a field emission gun (FEG) electron source. This SEM offers true low-vacuum imaging with a working vacuum of 2.0 Pa, providing a realistic field of view with excellent resolution and high-quality imaging. The gun has a long lifetime and operates at an astoundingly high 1.4 nm of resolution. The SEM is made with a newly designed, patented deflection system that integrates a high-speed reactive gas beam blanker and its associated mechanical elements for optimal imaging. This feature provides ultra-low dark current noise and high speed electron beam scanning to capture the finest of details as well as reducing the risk of damage to the sample. The SEM has an integrated beam deceleration system for brightfield images and beam scanning distortion correction for improved image contrast and detail resolution. The built-in second order correction at the column aperture enables high spatial resolution and uniform point spread function (PSF) over the entire imaging area. With its high-speed electron beam scanning, BZG-72WCST8H achieves reduced artifacts and noise in the images. The in-column energy filter and analysis capacity in the SEM gives element analysis capability surpassing what is achievable with other systems. Its high performance WDS/EDS capability is empowered through a high current matrix detector and sophisticated software, offering chemical element identification and quantitative analysis of different elements present in an SEM image. The software enables user friendly operation for both easy deployment and operation. It is designed to operate with multiple accessories over time, such as a BSE detector, RF coil, In-lens detector, SE detector, and EBSD. JEOL BZG-72WCST8H is an ideal piece of equipment for a variety of laboratory applications. Its high resolution imaging capabilities enable a wide variety of research, such as materials science, semiconductor wafer level inspections, nanotechnology applications, failure analysis and many more. Its flexibility and ease-of-use make it suitable for almost any research requirement.