Used JEOL BZG-73WCST6H #9282404 for sale

JEOL BZG-73WCST6H is a scanning electron microscope (SEM) that offers a comprehensive range of features and capabilities. This system is designed to provide superior resolution, with magnifications up to 500,000x and pbe resolutions up to 1.5nm. The accelerating voltage is adjustable from 0.05 to 30kV, allowing for a wide range of applications. This system also includes a field emission gun (FEG) that provides a high current density and a broad range of magnification settings. The beam current is adjustable from 0.5nA to 15uA, a high current density that provides exceptional sample imaging and analysis capabilities. The precision X-Y stage can perform positional accuracy of up to 0.1 micrometer, enabling your specimens to remain in place during imaging. The bright LEDs make visual inspection of your sample possible without the need to switch on the light source. In addition to the SEM performance, JEOL BZG-73WCS also offers a variety of sample preparation accessories. These include a vacuum charging unit, cryo stages for eu cryo-surface sample preparation, and sample holders. Nozzles and vacuum control elements, as well as a varioptic microscope for imaging coordination, are also available. JEOL BZG-73WCS also offers easy and intuitive software for data analysis and advanced image processing. The integrated 3D imaging and analysis tools help you to accurately measure and analyze the micro-size features of your sample. You can also use the software to amplify non-visible structural details and to achieve superior image quality. JEOL BZG-73WCS is capable of a wide range of applications, from general imaging to nanoscale analysis. Its outstanding performance and versatility make it ideal for research purposes. The advanced features and the broad range of sample preparation accessories offer the user a comprehensive range of capabilities.