Used JEOL BZG-73WCST6H #9282405 for sale

JEOL BZG-73WCST6H is a cutting edge scanning electron microscope that has superior performance capabilities in comparison to other SEMs on the market. It incorporates a OneView Lense detector and a high-performance SR detector, both of which are well-known for their advanced image capturing and analysis capability. As such, this instrument is ideal for applications such as electron beam lithography, nanolithography, and microfabrication. The field emission gun (FEG) source on BZG-73WCST6H is one of the most advanced and powerful on the market. This FEG offers a high current density, low noise floor, and low beam instability in order to facilitate accurate imaging with minimal distractions. Furthermore, it has a beam-blanking capability, allowing the user to accurately measure and analyze the relative distributions of emittance current. The ability to perform such operations quickly and accurately makes this instrument ideal for advanced materials analysis. JEOL BZG-73WCST6H also features a variety of sample preparation stages, ranging from conventional colloidal gold coating, vapor phase carbon coating, to freeze-fracturing, all of which are used in order to enhance imaging accuracy. In addition, the electron gun can be integrated with a charge detector, allowing the user to accurately analyze the local electric field characteristics of the specimen. BZG-73WCST6H offers superior resolution due to its 60kV ReFocusing Gun lens equipment. This system is paired with an Image Platform to optimize the signal-to-noise ratio and image quality. It also features an integrated EDS unit with a high-sensitivity detector, allowing for accurate and precise analysis of elemental composition. A brightfield detector is also included, offering contrast and depth of field enhancement. JEOL BZG-73WCST6H also features a software suite designed to maximize the efficiency and accuracy of SEM imaging. This machine includes a comprehensive 3D imaging software package for quickly and accurately constructing 3-dimensional models of microscopic structures. It also includes advanced analysis programs to facilitate topography scans, elemental mapping, and particle size analysis. All of the features on BZG-73WCST6H instrument make it an outstanding choice for both research and industrial applications. Its advanced FEG source, wide range of sample preparation stages, and powerful analysis programs all combine to make it an ideal choice for those seeking superior imaging capabilities.