Used JEOL BZG-75MST4H #9282265 for sale

JEOL BZG-75MST4H is a high-performance scanning electron microscope (SEM) that is suited for a range of applications across industrial and research applications. It is an adjustable electron microscope that is mainly suitable for medium-voltage applications in which the sample needs to be investigated at high resolution and accuracy. The main components of BZG-75MST4H include a field emission gun (FEG), a scintillator, an electron pole piece, stage controls and a set of high-voltage power supply. The FEG is used to create an electron beam from the sample to be studied. The scintillator enables the detection of reflected electrons so that the image produced can be visually observed. The electron pole piece is used to deflect and focus the electron beam to the specimen, as well as provide a field-free area for the collection of backscattered electrons. The stage controls allow the alignment of the sample and rotation of the sample. JEOL BZG-75MST4H is accompanied by an integrated motorised transfer equipment for automated sample exchange and increased productivity. The system includes JEOL Controller IV or the TE Gauge operated through its own menu unit. The machine also provides various imaging modes for the user depending on the nature of the studied sample such as the backscatter electron (BSE) mode, secondary electron (SE) mode, EFTEM mode, etc. BZG-75MST4H is a high resolution SEM that produces high quality images. The acquired images come with several useful features such as image composition, image capture and image storage. The software package that accompanies the SEM tool gives additional functionalities such as the ability to analyse data, image processing, 3D reconstructions and more. Moreover, the SEM features various capabilities such as high-resolution imaging, focus and aperture control, user-friendly operation, spectrum measurements, spectroscopy and automated imaging and processing. JEOL BZG-75MST4H is an effective scanning electron microscope that can be used for a range of applications including surface investigations, elemental composition assessments, investigations of failure, microanalysis and more. It is also suitable for an array of industrial and scientific investigations, making it an invaluable tool in the world of both industrial and scientific exploration.