Used JEOL FIB JFIB-2300 #9137333 for sale

JEOL JFIB-2300 Field-Emission Scanning Electron Microscope (FE-SEM) is a high-resolution scanning electron microscope designed for use in both research and industrial markets. The JFIB-2300 features an array of advanced technologies that enable optimal imaging of a wide range of samples. With its high-resolution imaging capability, the JFIB-2300 promises the highest performance in its class. The JFIB-2300 is designed with a new monochromator structure, a dual electron beam FIB (field emission FIB) equipment, and a direct detection system to provide high-resolution imaging. The high-sensitivity monochromator produces clear and high-contrast images and allows for the analysis of samples previously unachievable by other systems. The dual electron beam design allows for easier navigation of the sample area and improved responsiveness when changing beam parameters. The JFIB-2300 is capable of a maximum resolution of 1 nm and captures images up to 8 megapixels in size. The field emission gun has a maximum acceleration voltage of 30kV, which enables imaging of samples up to 8 micrometers thick. The direct detection unit also allows for up to 8x magnification. The JFIB-2300 also has a number of convenient features which increase its usability, including remote operation, angle/image analysis, and an automatic measurement machine. Its intuitive GUI makes it easy to operate and provides access to a variety of analytical information and tools. In summary, JEOL JFIB-2300 Field-Emission Scanning Electron Microscope is an advanced FE-SEM designed for use in research and industrial settings. With its high-resolution imaging capability, powerful electron beam tool, and a range of convenient features, the JFIB-2300 is capable of producing clear and accurate images of a wide range of samples. The JFIB-2300 is an ideal machine for those looking for high performance in an imaging asset.