Used JEOL FIB JFIB-2300 #9208934 for sale

JEOL FIB JFIB-2300 is a scanning electron microscope (SEM) with a built-in focused ion beam (FIB). It is an advanced analytical tool used for imaging and nanofabrication applications. FIB JFIB-2300 combines SEM imaging and FIB processing in a single system for higher resolution and accuracy. The FIB technology is made possible with its X-Y stage and high-precision linear motors for nanoscale positioning. This provides a high level of control to scan the sample at the highest resolution. It can easily move and rotate the sample in order to get the desired images. The high-energy secondary electron detector enables the capture of images with high levels of detail and clarity. JEOL FIB JFIB-2300 offers a wide range of beam currents and dwell times for increased imaging performance. It includes three detectors for different analytical operations: a secondary electron detector, a backscatter electron detector, and an in-lens detector. These detectors provide a wide range of analytical data such as phase and elemental composition. The SEM column of FIB JFIB-2300 produces a combination of high voltage, high current, and high vacuum power. This allows for the imaging of small features with high resolution and contrast, as well as for applying materials processing. Additionally, the integrated vacuum chamber ensures that there is no contamination while processing to prevent damage of samples. JEOL FIB JFIB-2300 is an intuitive and easy to operate system that provides fast and accurate performance. It is also equipped with an automated loading system to easily and quickly load a sample. This allows for quick analysis and data acquisition of the sample without requiring manual operation. Finally, it includes an integrated PC with powerful imaging and analysis software to help users quickly identify sample characteristics.