Used JEOL GC-310C/F #9384533 for sale

JEOL GC-310C/F is a scanning electron microscope (SEM) designed for molecular imaging, elemental analysis, and size measurement of nanoscale materials. Its high spatial resolution enables it to achieve the highest level of detail in samples as small as 10nm. The system uses both a variable pressure and a cold field emission gun (CFEG) source for its specimen examination and analysis. The microscope has an energy dispersive X-ray spectrometer (EDS) for elemental analysis, which provides users with fast and reliable elemental characterization in a variety of materials. It also features a dedicated Spectral Imaging Source (SIS) for spectral imaging, allowing for detailed mapping of different material phases. The GC-310C/F includes a HiGSD, which allows users to manually adjust the backscatter signal from the device for further additional specimen detail. The SEM is specially designed to offer exceptional stability and precise imaging, even in field-emission gun environment. It uses a unique shielding design that helps to reduce high beam currents and reduce sample damage. The GC-310C/F also includes an integrated camera system that captures images at a high speed, and with an integrated A-scan system, users can easily measure the thickness of samples as they analyze them. The SEM is designed to be energy efficient and take advantage of lower power costs. It is also light enough to be carried to different locations for on-site testing. For laboratories that already possess the necessary expertise and equipment, the setup process is simple and straightforward. JEOL GC-310C/F has a variety of applications, including materials research, semiconductor fabrication and development, nanomaterial synthesis, thin film analysis, surface and interfacial analysis, and device performance testing. Overall, JEOL GC-310C/F is a powerful and versatile SEM with a variety of features, making it an ideal choice for any laboratory.