Used JEOL / HOLON EMU 220A #9352072 for sale

JEOL / HOLON EMU 220A is a state of the art scanning electron microscope (SEM) equipped with a wide range of analytical capabilities. It is capable of imaging down to a resolution of 1.4nm and a magnification range up to 450kX. JEOL EMU 220A utilizes a unique, multi stage reduced pressure, by introducing a high vacuum at the electron gun which increases the imaging resolution. The on board electronics allow the microscope to achieve exceptional contrast and resolution even at low accelerating voltages, ensuring high quality images at any voltage. HOLON EMU 220A is equipped with a host of advanced electron optics, including solid state detectors for high-resolution imaging, a three-quadrant deflector for precision positioning of the electron beam, and a high current, highly stable gun with an optimum source-object distance which eliminates astigmatism and enhances image quality. Energy dispersive X-ray (EDX) detectors allow this SEM to analyze elemental composition of the sample. A cryo-stage provides improved image resolution and sample recognition, while high stability and low temperature operation makes it the ideal choice for sensitive imaging applications. EMU 220A also comes with a range of data acquisition and analysis capabilities. Its software provides for image capture, processing and analysis with a point-to-point analysis tool. With JEOL / HOLON EMU 220A, users can program automated pattern acquisition and pattern recognition using its large array of data acquisition and analysis tools. This microscope also incorporates advanced surface analytics, particle analysis and tomography techniques. It is the ideal choice for researchers in a variety of fields, in particular, those requiring high resolution imaging and analysis.