Used JEOL JBX-6000FS #293749103 for sale

JEOL JBX-6000FS, a scanning electron microscope (SEM), provides imaging technologies to allow for the analysis of wide range of materials' microstructures. It is designed to perform high resolution imaging and analysis, with high precision sample positioning the key to its success. JEOL JBX-6000 FS utilizes a patented variable pressure Schottky field emission (FE) electron source. This source features exceptional resolution of 1nm and contrast of better than 20,000. The FE source also provides an increased energy range of 30kV, making it capable of analyzing diverse structures between light and heavy elements. JBX-6000FS features a dual detector design to enable greater flexibility with the collection of various signals. It is fitted with the 'EverHigh™' detector system combining two detectors, a large area secondary electron (SE) detector, and a transmission electron (TEM) detector to enable the detection of both backscattered and secondary electron signals for a comprehensive imaging structure. JBX-6000 FS is also built with an ergonomic open type focusing column system, allowing for easy maintenance and service, with a design that improves productivity and system performance. This ensures the analysis of samples is accurate, precise and reliable. The easy to use "DataXplore" control software makes it simple for the user to control and optimize the functions of the microscope. The software enables the user to select or achieve the desired magnification, set the beam current, image focus, and contrast level. This software also provides a range of image processing functions, such as image stitching, and allows for the overlay of multiple images, providing a more precise understanding of microstructures. JEOL JBX-6000FS provides precise and reliable imaging infrastructure to allow for the analysis of a various properties and characteristics of a sample. It enables a range of images to be generated and analyzed to gain greater insight within the microstructure.