Used JEOL JBX-6000FS #9273681 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

JEOL JBX-6000FS
Sold
ID: 9273681
Wafer Size: 4"
Vintage: 1996
E-Beam inspection system, 4" 1996 vintage.
JEOL JBX-6000FS scanning electron microscope (SEM) is an industrial, benchtop instrument that offers high performance imaging with superior practicality and affordability. It has a large, comfortable sample chamber with excellent temperature regulation capabilities, an ergonomic design with a large open-front window for easy access and a wide variety of imaging and analytical software available. JEOL JBX-6000 FS is equipped with a field-emission SEM source which provides a high resolution and high contrast imaging option, as well as a comprehensive range of hardware and software for imaging and analysis. Its easy-to-use design and intuitive controls make it simple to operate. It can be used to image complex biological and organic materials, metallic fragments, nanomaterials, fabrics, medical devices and more. JBX-6000FS has high resolution imaging capabilities with a maximum resolution on the order of one nanometer. A range of automated features make imaging easier and faster with JBX-6000 FS, including scan auto-tuning, computer-controlled stage, and automated image analysis. It also has a range of detector options to customize the imaging process. JEOL JBX-6000FS has a variety of imaging modes available, including standard SEM modes, high-vacuum view mode, backscatter mapping mode, and variable pressure imaging at ultra-high vacuum (UHV). It also has a range of analytical techniques available, such as elemental analysis through energy dispersive spectroscopy (EDS) and secondary electron imaging (SEI). Other features of JEOL JBX-6000 FS include its touchscreen display for easy navigation and image optimization, an integrated energy-filtering system, a motorized sample stage for automated navigation, and a programmable scan rate. The microscope is also equipped with an integrated Bruker AXS EBSD system for electron backscatter diffraction (EBSD) mapping. JBX-6000FS provides a robust, high-performance scanning electron microscope, comfortable ergonomics, advanced imaging features and fast, reliable analysis capabilities. Its range of hardware and software make it an ideal choice for industrial, biological, nano-materials and medical imaging applications.
There are no reviews yet