Used JEOL JEM 100C #9408448 for sale

JEOL JEM 100C is a scanning electron microscope (SEM) specifically designed to meet the needs of nanoscale imaging and analysis. The 100C is capable of performing high-resolution imaging and spectroscopy on a wide range of samples. This versatile instrument can be used to gain insight into the microstructure and chemical composition of a variety of materials, from organic polymers and fibers to semiconductors and metals. At the heart of JEM 100C is a multi-pole Schottky field emission gun (FEG) that provides superior brightness and resolution. It utilizes a monochromator to select a single wavelength of electrons and increase the signal-to-noise ratio. This, coupled with its low lens-aberration have resulted in an extremely high resolution imaging of up to 0.07nm. Additionally, an ultra-high vacuum (UHV) inner chamber ensures that sample signals are not interfered with by environmental gases. The instrument features a range of automation features, such as automated specimen loading, stage drive, and sample alignment. It also includes an integrated processing software for research work, making it easy to seamlessly manage data. The 100C also features an automated vacuum pumping system, allowing for rapid evacuation of the system. JEOL JEM 100C is capable of operating in a wide range of modes, including secondary electrons imaging, backscattered electrons imaging, and electron beam induced deposition. It has the capability to detect and analyze elemental composition of the sample using energy-dispersive and wavelength-dispersive X-Ray spectroscopy (EDX and WDX, respectively). JEM 100C is an excellent choice for applications requiring the highest resolution images and the ability to analyze the chemical composition of a variety of materials. Its low aberration lenses, highly efficient FEG and UHV system provide superior imaging and analysis capabilities. Together, these features make JEOL JEM 100C an ideal tool for anyone looking for clear, high-resolution images and precise elemental analysis.