Used JEOL JEM 100CX-II #293643256 for sale
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JEOL 100CX is a scanning electron microscope (SEM). It is a versatile tool for imaging the surfaces of solid materials with a high level of detail. 100CX has a range of capabilities, including the ability to image with a resolution down to 1 nanometer, and to analyze the composition of samples with its energy-dispersive X-ray spectroscopy (EDS) detector. The unit features a cold field-emission gun that can be operated at high vacuum, low vacuum, and environmental modes. This allows for greater flexibility in sample imaging and analysis. The image magnifications on JEOL 100CX extend from 6x up to 600,000x, making it suitable for a wide range of applications. 100CX's automated functions allow for easy operation of the microscope. These include a fully automated stage for loading, positioning, and examining samples quickly and efficiently. The stage is capable of allowing for fine adjustments to the position of the sample and providing tilt angles of up to 25°. The operation of JEOL 100CX is divided into three distinct modes. These include a Sample Imaging mode in which an image is captured with the SEM, a Scanning mode where a line scan is performed with the SEM, and a Measurement mode which allows the user to take measurements on the sample. 100CX also has a comprehensive list of software features to help with the analysis of samples, including X-ray mapping and thickness mapping. The versatility of JEOL 100CX makes it suitable for a range of samples, including biological specimens, semiconductor devices, nanomaterials, and metals. The SEM's ability to operate in high vacuum, low vacuum, and environmental modes provides flexibility for sample imaging and analysis. Its automated functions make it easy to use, making it well suited for research and industrial applications.
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