Used JEOL JEM 100CX #199569 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
Sold
JEOL JEM 100CX is a scanning electron microscope (SEM) designed to provide high-resolution images of surfaces at various magnifications. This device is useful for a wide range of research, engineering, and industry applications. It is composed of an electron gun, column, column controller, scan generator, and specimen chamber. The electron gun produces a beam of electrons, which is focused into a narrow beam using the column and its controller. The beam is directed to the scan generator, which is responsible for deflecting the beam in a raster pattern. The final component, the specimen chamber, holds the specimen and contains an internal vacuum to prevent air molecules from interacting with the beam. JEOL JEM 100 CX has a maximum resolution of 1.2 nm, which allows it to create images of incredible detail. With the help of the built-in controller, it can be controlled with ease and easily adjusts to the desired size, shape, and speed. Furthermore, the device can be operated under a variety of scan parameters for different applications. This includes X-ray spectro-analysis, which allows for the analysis of the elemental composition of the specimen. In terms of usability, JEM 100CX is an incredibly user-friendly device. The intuitive control system allows for smooth operation and a range of imaging options. This includes features such as digital magnification (DMG), digital contrast enhancement (DCE), edge enhancement (EE), and beam deflection. Additionally, its easy-to-use software enables users to customize images and simplify analysis. Thanks to its enhanced operational, safety, and performance features, JEM 100 CX is extremely practical and reliable. It comes with a variety of protective measures, such as an electromagnetic safety valve, chamber cool-down timer, and emergency stop button. It also features a full-automatic shut-off system that activates when the specimen is too close to the electron beam. Additionally, some models come with an integrated dust-collector device and water-circulation unit for easy maintenance. Overall, JEOL JEM 100CX is a powerful scanning electron microscope that provides a high degree of accuracy and resolution. With its robust safety and performance features, its user-friendly control system, and its various imaging options, this SEM is an excellent choice for a variety of research, engineering, and industry applications.
There are no reviews yet