Used JEOL JEM 100CX #9250015 for sale

JEOL JEM 100CX scanning electron microscope is a high-end piece of laboratory equipment used in both research and industrial settings. It features an integrated digital imaging system, allowing for high resolution imaging of specimens at up to 500,000X magnification. The scanner itself features an optimized design for imaging stresses in the sample, and a unique galvanometer-based electron gun ensures that no astigmatism is present in the images taken. This, coupled with a precise beam pinpointing system, allows for even more detailed images. JEOL JEM 100 CX is built with an ultra low vacuum environment. This reduced level of background debris gives notable improvements in electron transparency and electron efficiency in images taken with the device. An electron mirror is present, which helps to minimize aberrations and astigmatism in the electron beam, giving more accurate images. In terms of data output, JEM 100CX is capable of producing digital images up to 24 bits. Image processing can be remotely applied, making it easy to apply a range of corrected images from a single scan. In addition, the on-board SPI software allows for automated measurements of geometric dimensions of the sample. JEM 100 CX also offers a range of scanning modes, such as contact mode, variable pressure mode, and low level sensitivity mode. This allows for more fine-tuned images and analysis of desired features, and can help to improve overall results. Overall, JEOL JEM 100CX is a high-end scanning electron microscope which performs well at a variety of tasks. Its performance is especially advantageous in research and industrial settings, thanks to the minimized astigmatism and background debris present. By providing integrated digital imaging and data outputs, it is easy to acquire and analyze data from specimens. With the various scanning modes available, it is possible to tailor the imaging process accordingly, yielding high quality results.