Used JEOL JEM 100CX #9257453 for sale

JEOL JEM 100CX is one of the most powerful scanning electron microscopes (SEM) available on the market. It carries a total of 4 port tubes, making it a multi-function system with various capabilities. The 100CX is a stable and reliable device that can operate for long periods with minimal maintenance and is capable of scanning samples from a wide variety of areas and with a range of resolutions from a few nanometers to over 10 micrometers. JEOL 100CX is designed to optimized its field emitters and optimize its imaging performance by using both the secondary as well as backscattered electrons. This combination allows for optimal resolution of the sample, both in terms of clarity and detail. The 100CX is a high-performance planar SEM, which makes it ideal for imaging delicate two-dimensional samples like isolation transistors or biological specimens. These permits to study and to produce 3D images of them. Thanks to the built-in combined detector section, the 100CX can also be used for both elemental and chemical analysis. The standard type of detector includes an EBIC, BSE detector, an energy-dispersive X-ray spectrometer, and a WDS or a RBS detector. The EBIC detector module facilitates high-resolution imaging of the sample since the electron signal is optimized to the feature, while the BSE detector module generates secondary electrons. The remaining two detectors enable energy dispersive X-ray analysis as well as RBS (Rutherford backscattering spectrometry) and WDS (wavelength dispersive spectroscopy). JEOL 100CX can also control its stage and specimen height with a precision of 50 microns, giving users the ability to focus on the surface of the sample for increased resolution. The low-vacuum mode of the instrument also allows for the examination of a wide range of samples, from non-conductive samples to highly conductive samples. Other performance features of JEOL 100CX include low noise levels and low voltage operation, a wide acceptance angle detector, and a mechanical scanner that is accurate to within a few nanometers. Furthermore, the 100CX also makes it possible to control both magnified and reduced surface scanning easily with its low magnification capability. When put together, the features of JEOL 100CX make it one of the most effective SEMs available for high-level research. This model is considered an industry-standard both for universities and industries, given its wide range of functions and capabilities coupled with its high level of performance. In conclusion, JEOL JEM 100 CX is an ideal choice for those looking to carry out high-level research with a powerful and reliable scanning electron microscope. With its wide range of detectors, port tubes, and exceptional imaging capabilities, the 100CX will provide even the most demanding user with the tools they need to explore the nanoscale.