Used JEOL JEM 100CX #9302750 for sale

JEOL JEM 100CX scanning electron microscope is a high-resolution imaging and analytical instrument used for the characterization of a variety of samples in a wide range of applications including; materials science, medicine, geology, and biology. The microscope is equipped with a tungsten filament electron gun which produces an electron beam focused onto the sample by an electrostatic lens equipment. The sample is scanned by the electron beam and secondary electrons emitted from the sample's surface are collected in order to render a high resolution image. JEOL JEM 100 CX has dual scintillators and two cameras to ensure superior performance and image quality. The system can operate in two contrasting modes; secondary electron imaging (SEI) and back-scattered electron imaging (BEI). The low voltage SEI mode generates highly detailed images of the sample while the BEI mode provides surface contrast to show the appearance of different materials on the surface. JEM 100CX offers a remarkable 12 kV dynamic range and dual resolution capability of up to 3980x2950 pixels. JEM 100 CX features a wide range of advanced analytical capabilities such as Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD). The EDS unit allows for identification of the elemental composition of the sample, while the EBSD machine enables mapping of grain orientations throughout the sample allowing for analysis of microstructure. JEOL JEM 100CX also comes equipped with automated image stitching capabilities, enabling images of samples larger than the field of view to be created using a series of overlapping images. JEOL JEM 100 CX is a reliable and efficient scanning electron microscope tool perfect for the study of a variety of materials. Its sophisticated design featuring advanced imaging capabilities makes it an excellent tool for nearly any application.