Used JEOL JEM 1010 #293607208 for sale

JEOL JEM 1010 is a scanning electron microscope (SEM) for the imaging of materials in great detail at both the micrometer and nanometer levels. This SEM gives users access to a 3-D view of the sample with a high-performance imaging solution. JEM 1010 can magnify objects up to 300,000x, allowing users to observe even the most minute surface features and provide an unmatched level of detail and accuracy. JEOL JEM 1010 is equipped with an accelerating voltage of 0.1- 30kV, secondary electron detector and a TV camera to facilitate parallel imaging. This SEM also contains an Everhart-Thornley detector, which provides excellent signal-to-noise ratio and spatial resolution to detect even the smallest and most intricate features. In addition, the device is fitted with a Split Beam Detection system to reduce the time spent on taking each image and enhance the signal-to-noise ratio of the SEM image. To further improve image resolution, JEM 1010 also contains built-in Miller Index controls. Miller Index enables features up to atomic resolution from the specimen image onscreen. The Miller Index utilises a projection type electron gun and a driving Turbomolecular pumping device, resulting in highly accurate, high-quality images. JEOL JEM 1010 also includes an intuitive, user-friendly software platform with a range of functions to improve the quality of images taken. These include functions such as contrast and brightness control, image enhancing, EDX, EELS, and PGT analysis. Furthermore, the platform allows users to save, store, and transmit their images and also offers a wide selection of materials library, including metals, alloys, and other materials. Finally, JEM 1010 is the ideal choice for both research and industrial applications. Its versatile design and advanced imaging capabilities make it a reliable, cost-effective choice for users looking to obtain detailed analysis and breakdown of specimens.