Used JEOL JEM 1010 #9302701 for sale

JEOL JEM 1010 is a scanning electron microscope (SEM) designed to produce high resolution images and analytical data at magnifications ranging up to half a million times. At the core of the equipment is its electronic gun, which generates a high-energy electron beam that is used to detect, analyze and image surfaces and material structures at nanoscale. The system is equipped with an advanced imaging unit that allows for an S-shaped scan to capture data with a resolution down to 1nm. It also includes a high-resolution backscatter detection machine for materials analysis and a computer with an integrated analytical software platform for data analysis. At the heart of the tool is its electron gun, which is capable of generating electron beams with an accelerating voltage range of 0.5-30 kV and a beam current of 1 nA. The gun includes an electron source, condenser lens and objective lens, along with several other lenses and apertures for fine-tuning. The asset is equipped with a conventional thermoelectron emitted and a field emission gun source. The control model is designed with precision scanning and a highly sophisticated control equipment which allows for very accurate image positioning and manipulation. The image is generated by the motion of the electron beam over the sampled surface, which is scanned in order to capture the desired data. Once the image is acquired, it can be processed and analyzed with the software provided. JEM 1010 also includes a variety of specialized analytical capabilities, such as energy dispersive X-ray spectroscopy (EDX), electron energy loss spectroscopy (EELS), elemental mapping and spatially resolved spectroscopy. In addition, the system allows for examination of non-conducting surfaces with the use of a low voltage backscattered electron detector, which allows for analysis of both topographical features and surface features. JEOL JEM 1010 scanning electron microscope is a highly versatile, user-friendly unit that enables researchers to capture high-resolution images and analytica data from delicate nanoscale samples and materials. By combining its powerful electron gun, sophisticated imaging and analytical capabilities, and an integrated software machine, the tool is an ideal tool for research and development in a wide variety of applications.