Used JEOL JEM 1011 #293654724 for sale

JEOL JEM 1011 is a high resolution scanning electron microscope (SEM) capable of producing images of samples with extreme precision and detail. The design of the instrument allows for the operation of two imaging modes: secondary electron imaging (SEI) and backscattered electron imaging (BEI). In SEI mode, JEM 1011 utilizes a focused electron beam to scan the sample surface, causing secondary electrons to be emitted from the upper surface of the specimen. The secondary electrons are then collected by a detector at the base of the instrument and are measured and processed by a computer, allowing for the creation of an image. In BEI mode, the focused beam is still used to scan the sample surface, but some of the electrons are instead scattered from the internal properties of the specimen, allowing for the creation of an image of its cross-section. The instrument is also able to measure the energy of the emitted secondary electrons, revealing information on the nature of the sample's surface. This measured data is then used to create an energy-dispersive spectroscopy (EDS) map, which can be used to determine the sample's elemental composition. The power of JEOL JEM 1011 also extends to its ability to exectute a variety of sample sizes and manipulation techniques. The system has an adjustable stage for dynamic sample handling, as well as an automated sample alignment setting for samples up to 10cm in diameter. JEM 1011 has a field emission gun (FEG) electron source, capable of producing high brightness electron beams with a low operating voltage. This ensures that a high resolution image is achieved when imaging samples. The high manoeuvrability of the electron beam can also be adjusted to provide stable surfaces for imaging, while also reducing chemical contrast effects. Additionally, JEOL JEM 1011 is equipped with analytical software packages which can be used to quantify data about the sample's composition and characteristics. To simplify the operation of the instrument, JEM 1011 comes with a user friendly graphical user interface which allows the technician to control settings easily. There are also a range of other useful accessories which can be combined to improve the system. This includes magnification control and stage fiducials, which help to optimize the accuracy of image acquisition as well as the accuracy of the X-Y sample positioning. Overall, JEOL JEM 1011 is a powerful scanning electron microscope with versatile capabilities, making it a great choice for many imaging and analysis needs.