Used JEOL JEM 1011 #293658628 for sale

JEOL JEM 1011 is an advanced scanning electron microscope (SEM) designed for imaging and analysis of a variety of samples ranging from biological to mineral and materials science specimens. It is capable of operating in both high and low vacuum, and features a large field-of-view, photomultiplier detections and advanced control systems. JEM 1011 provides high resolution imaging with resolutions down to 1nm in the secondary electron (SE) mode, and 0.5 nm in the backscattered electron (BSE) mode. The SEM utilizes a very high energy electron beam to record images of a sample's surface. The source of the electrons is a heated tungsten filament, or field emitters, controlled by a feedback system that allows precise control over the beam current, energy, and spot size. All parameters can be adjusted to deliver optimum conditions for specific types of samples. The sample holder is designed to hold standard SEM samples and can be tilted in up to two directions, allowing image acquisition from various angles. To detect the electrons emitted from the sample, JEOL JEM 1011 is equipped with a large-diameter, low-noise photomultiplier detector. It is designed for highly accurate positioning and has a low noise preamplifier for optimal signal detection. The detector can detect backscattered electrons, secondary electrons, or various types of X-rays (characteristic, diffraction, etc.). To facilitate imaging of large surfaces, JEM 1011 is equipped with an automated stage and sample navigation system. This allows users to quickly and accurately scan sample surfaces, and provides an overview of the sample to more quickly identify regions of interest. In addition, JEOL JEM 1011 is equipped with a powerful software suite, allowing users to adjust all settings of the SEM, as well as analyze and manipulate images. This includes tools for quantitative image analysis, image stitching for large fields-of-view, and a range of image enhancement algorithms. JEM 1011 provides a wide range of capabilities for imaging and analysis of sample surfaces, allowing users to quickly and accurately characterize their samples. Its combination of high resolution imaging, sophisticated sample handling systems, and intuitive software make JEOL JEM 1011 an ideal instrument for high-resolution imaging and analysis.