Used JEOL JEM 1011 #293666358 for sale

ID: 293666358
Transmission Electron Microscope (TEM) Does not include EDS / Camera.
JEOL JEM 1011 is an environmental scanning electron microscope (ESEM) that offers excellent technological capabilities. Its unique combination of design features and performance capabilities make it the ideal instrument for high-resolution imaging of a wide variety of specimens. JEM 1011 is equipped with an improved signal-to-noise ratio system and variable polepiece lenses that feature both high and low numerical apertures, which make the image resolution high even at low magnifications. This microscope also utilizes an automated alignment and Focus Lock system to quickly and accurately maintain the focus plane of carbon, nonconducting, as well as conducting specimens without needing frequent manual focus adjustments. It is equipped with a high-sensitivity SE/B detectors that can accurately detect low-energy signals. Additionally, it can operate in both high and low vacuum modes to further increase the detector's sensitivity. This allows users to acquire high-quality images and data regardless of the specimen type or its environmental conditions. The user experience is further enhanced with JEOL JEM 1011's EDS microanalysis system that is capable of analyzing specimens with submicron resolution and can accurately detect trace elements down to the ppm level. This microscope is also equipped with a magnification range from 3000 - 400,000 times. In addition to these features, JEM 1011 has an improved viewing and control console as well as a built-in, high-performance video camera to allow users to observe the images being acquired in real-time. It is also capable of displaying both three-dimensional and topographical cross-sectional images. JEOL JEM 1011 is a powerful tool for imaging specimens at increasingly high resolutions and is capable of producing images with crisp clarity and accurate details. Its combination of technical capabilities provide users the ability to analyze materials at a resolution that has not previously been possible with traditional scanning electron microscopes.
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