Used JEOL JEM 1200EX II #9250371 for sale

JEOL JEM 1200EX II is a high performance scanning electron microscope (SEM) designed for versatile nanocharacterization applications. This model features a field emission gun (FEG) for improved electron optics and higher resolution imaging. The microscope also incorporates a high-stability x-y stage for fast and accurate sample scanning. The SEM includes an in-lens detector (IED) to detect secondary electrons (SEs) and a backscatter electron (BSE) detector to provide a better contrast on different sample conductivities. The electron GUN has an accelerating voltage ranging from 1kV to 30kV and sample current up to 200nA, making it ideal for nanocharacterization applications in materials science, biological and industrial research. JEOL JEM 1200 EXII is equipped with an ultrahigh-vacuum (UHV) technology which ensures high level of microscopy vacuum and cleanliness, allowing the structure of the sample can be observed without any interference from air molecules or charged particles in the beam. The microscope can also be used to analyze cryo-suspended samples which are cooled to very low temperature through a cold chuck accessory and nitrogen gas. The high-resolution 3D images are obtained with a 16 bit CCD camera, improving the accuracy and resolution of the sample images. The digital camera gets connected to the SEM turret where bright field (BF) detector, dark field (DF) detector and backscattered electron (BSE) detector can be used. JEM 1200EX II offers a wide choice of accessories including a cathodoluminescence (CL) detector, energy-dispersive spectroscopy (EDS) detector, finite-element field-emission lens and a motorized x-y stage for automated sample scanning. The application software bundled with JEM 1200 EXII allows for customizable imaging and analyzing of the samples. The software contains several preset image parameters and auto-optimize feature which allow users to obtain consistent imaging performance. It is also possible to store images and prepare presentations in different formats. The optional Analyze software for automated and advanced analysis further improves the imaging results achieved with this model. Overall, JEOL JEM 1200EX II is an ideal choice for nanocharacterization applications. It offers excellent imaging features and is easy to use. The software integration allows for precise imaging and automated image processing, making it an invaluable instrument for researchers.