Used JEOL JEM 1200EX II #9250558 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
Sold
ID: 9250558
Transmission Electron Microscope (TEM)
Magnification: 50x to 500,000x
GATAN ORIUS CCD Side mount digital camera
Standard magnification mode:
SAP10B: 800 to 600,000 times, 30 steps
SHP10: 1,200 to 1,000,000 times, 30 steps
SAP10: 600 to 500,000 times, 30 steps
Selected area magnification mode:
SHP10B: 4,000 to 500,000 times, 22 steps
SAP10: 2,000 to 250,000 times, 22 steps
Low magnification mode: 50 to 1,000 times, 14 steps
Electron diffraction camera:
Display: Digital, film printout
Selected area electron diffraction:
SAP10B: 150 to 3,500 mm, 15 steps
SHP10: 100 to 2,500 mm, 15 steps
SAP10: 200 to 5,000 mm, 15 steps
High disperation diffraction: 4 to 80 m, 14 steps
High resolution diffraction: 337 mm
Electron gun:
Type: Cool beam
Filament: Pre-centered hairpin type, DC heating
Bias: Self bias, continuously variable
Alignment: Electromagnetic 2-stage interlock system
Anode chamber valve and electron gun lift:
Built-in
Pneumatic control
Condenser lens: Electromagnetic, double condensers
Beam tilting angle: Maximum 6°
Specimen exchange: Airlock mechanism
Loading capacity: (2) Specimens
Specimen movement range:
X, Y Directions: ±1 mm
Z Direction: +0.2, -0.3 mm
Camera chamber:
Film size J: 59 mm x 81.5 mm
Loading capacity: Up to 50
Feeding and shutter: Automatic and manual
Exchange mechanism: Airlock type
Evacuation system:
Vacuum pumps: Oil rotary pump and oil diffusion pump
Ultimate pressure: 10^-5 Pa
Cooling water:
Flow space: 5 I/min
Pressure: 0.1 to 0.5 MPa
Temperature: 15°C - 20°C
Ground terminal: 100 ohms or less, 1
Power supply: 200-240 V, 50/60 Hz, 6.5 kVA, Single Phase.
JEOL JEM 1200EX II scanning electron microscope (SEM) is a sophisticated piece of scientific equipment, ideal for investigating the physical properties of solid materials at the microscopic level. The SEM operates on the principles of charge liberation and detection from the surface of a sample, allowing for high-resolution imaging and analysis. Through the use of varying operating conditions such as voltage, magnification and working distance, the SEM can produce images up to 4 nanometers in resolution with a depth of field of 30 µm. JEOL JEM 1200 EXII is designed for users of all levels. Its user-friendly interface makes it easy to control and set up, with dedicated buttons for commonly-used functions. The operator can easily switch between imaging modes like multi-beam SEM imaging for improved contrast and resolution, or back-scatter imaging for better recognition of surface features. In addition, the microscope can be equipped with a number of accessories to enhance its performance and usability such as sample holders, gas-control systems, and automated sample exchange systems. JEM 1200EX II combines high performance, low network complexity, and ease-of-use to provide optimally reliable imaging for a range of materials science applications. It is equipped with a field-emission gun and a system for maximizing long-term performance. This system filters out debris from the gun chamber, prolonging gun life and providing consistently high-quality images. The electron gun also employs a high-resolution monochromator for improved color accuracy and better image contrast. JEM 1200 EXII can be used with a variety of environmental conditions such as high or low pressure, high or low temperature, as well as with gas, liquid, or solid samples. With its automated sample exchange system, the microscope can easily switch between samples without any manual labor. Further, the SEM offers optional software options to control the microscope, measure and analyze images, and even to store and manipulate data. JEOL JEM 1200EX II is a powerful and versatile scanning electron microscope designed to provide imaging and analysis of objects at the microscopic scale. With its high performance, ease of use, and flexibility, the microscope can help researchers quickly and accurately analyze materials for a wide variety of applications.
There are no reviews yet