Used JEOL JEM 1200EX #293604002 for sale

JEOL JEM 1200EX is a scanning electron microscope, combining advanced design with state-of-the-art technology. It is equipped with a 1.2 mm object size view-field, ideal for an extended view of dynamic operations and low-angle views. The electron optics gives an exceptional level of performance with an intermediate spherical aberration coefficient, low-voltage operation, and a new advanced design which ensures maximum image quality with low 2pV intra-image noise. Beam currents of up to 50 nA are available, providing excellent throughput for higher resolution or finer surface detail imaging. It is equipped with an additional feature, a special high-efficiency large-area backscatter detector. JEM 1200EX provides an intuitive advanced user interface with dedicated work-spaces for signal processing, automatic rulers, charts and advanced statistical analysis. The microscope also features an automated sample positioning system, allowing easy mechanical control of sample positioning and sample orientation during scan, tilt and rotation operations. User convenience is also facilitated by a multi-function detector system, integrated pre-amplifier and signal processing, high resolution monitor, parallel imaging capabilities, and a wide range of sample mountings. The microscope can also be augmented with additional accessories, such as an integrated automation stand, enabling optimized high throughput operation. Additional advantages of JEOL JEM 1200EX include its low-noise background, low maintenance, reliable operation and its versatility. Its ergonomic design makes it easy to maneuver and allows for quick access to all areas of the microscope. JEM 1200EX provides an effective solution for researchers seeking high-level performance and demanding imaging applications. Its advanced features, superior performance and innovative design make it a popular choice amongst scientists, researchers and educational institutions.