Used JEOL JEM 1200EX #293689969 for sale
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JEOL JEM 1200EX is a scanning electron microscope (SEM) that has revolutionized nanostructure imaging with its exceptional performance and powerful capabilities. This SEM offers advanced enabling technologies such as in situ material analysis, aberration correction, high-precision scanning, and more for improved imaging quality. It has a variable pressure imaging capability, providing a resolution of 1 nm or better for imaging of wider samples, especially at sub-micron levels. JEM 1200EX also features a thermally-insulated vacuum chamber for enhanced sample observation and preservation. JEOL JEM 1200EX has an advanced electron column design that allows for a high-quality imaging resolution of 1nm with its aberration-corrector and off-axis illumination. This SEM is equipped with dedicated primary electron gun systems for efficient viewing even at high acceleration voltages, and a scan generator to ensure high image quality regardless of scan speed. The tight integration of these components makes for a highly accurate and precise scanning process. And its high-brightness cold field emission technology helps extend the lifetime of the electron gun, significantly improving detection times for desired images. The quality of JEM 1200EX's images are further enhanced by its FIB-SEM lithography tools, which combine the capabilities of the electron microscope and a focused ion beam (FIB) for high-resolution sample manipulation. This allows the user to create, modify and test extremely small structures, making it an ideal tool for cell biological and nanotechnological research. The FIB-SEM can also be used for nanoscale etching and deposition, allowing users to rapidly and effectively modify the surface out of range of conventional nanofabrication techniques. Another advantage of JEOL JEM 1200EX is its flexible architecture which allows for remote operation and optimal configuration of the microscope. It is equipped with a computer touch panel in the front door of the column, facilitating the user's access to camera and system settings, as well as sample selection and scanning. The system can also be connected to various external devices for sample loading, imaging, and analysis. In conclusion, JEM 1200EX is a powerful and versatile scanning electron microscope that offers a host of advanced imaging technologies and features for improved sample observation and manipulation. Its 1nm resolution, high-brightness electron gun, capable scan generator, and FIB-SEM features make for incredibly accurate imaging and sample manipulation at the nanoscale, making it a must-have tool for nanotechnology and cell biology research.
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