Used JEOL JEM 1200EX #293826789 for sale

JEOL JEM 1200EX is an advanced transmission and scanning electron microscope, capable of extracting highly detailed, three-dimensional images from a sample with exceptional precision and accuracy. This sophisticated piece of equipment utilizes the highest resolution digital imaging technology providing superior contrast, resolution and quality of digital images. Its detailed analysis and imaging capabilities allow users to observe and quantify characteristics of samples at the nanoscopic level. With a resolution of up to 0.75nm, JEM 1200EX has superior imaging capability and performance allowing it to effectively identify and characterize various nanostructures and features of samples. This model also features a two-axis scanning system and is equipped with an automated stage, allowing users to easily move the sample without the need for manual steps. With this two-axis scanning feature, researchers can observe and analyze samples in the X, Y and Z directions simultaneously, allowing for more accurate results when examining particles and structures. In addition to its superior imaging capability, JEOL JEM 1200EX also features various analysis options. It comes with a host of elements and compounds analysis modes, from backscatter electron, transmission electron and semiquantitative x-ray devices for spotless and spectroscopic analysis. The built-in energy filter allows for accurate selection of the most suitable electron beam energy for each analysis task and permits higher resolution analysis of surfaces, materials and devices. Highly efficient signal processing with its very low noise performance improves contrast and signal-to-noise ratio for digital images by taking advantage of optimized signal amplification algorithm. For greater convenience, JEM 1200EX includes software packages for easy setup, operation, and maintenance. This feature provides researchers with a complete workflow of sample evaluation and data analysis, ensuring accuracy and consistent results. All in all, JEOL JEM 1200EX is a powerful scanning electron microscope designed to enable high-resolution imaging, analysis and visualization of samples with superior precision and accuracy. With a wide range of features, advanced technology and software packages, investigators can obtain reliable data and results with the highest resolution available.