Used JEOL JEM 1200EX #293830721 for sale

JEOL JEM 1200EX scanning electron microscope (SEM) is a high-performance analytical tool for imaging biological samples, metals, ceramics and semiconductors. Capable of resolutions down to 1 nm, the SEM is ideally suited for wide range of research and industrial applications. It is a electron microscope that provides both high-resolution imaging as well as microanalysis capability. JEM 1200EX is built as an open equipment, enabling easy integration into existing laboratory setups. The SEM is equipped with an ultra-high vacuum chamber and a range of advanced detectors including a secondary electron detector, a back-scattered electron detector, and an energy-dispersive X-ray detector. The SEM is driven by an advanced electronics system featuring processing power for optimized imaging. Through this electronics unit, the SEM is capable of powerful analysis features, such as automated peak detection and whole-particle analysis. Additionally, the SEM features bright field and dark field imaging capabilities, allowing for in-depth investigation of sample structures and surface features. The SEM offers aresolution pf 0.7 nm, and a highest magnification of up to 30,000X. Additionally, the machine is capable of automated tilt functions, allowing for quick scanning of sample features in high-angle oblique (HAO) illumination mode. The backscattered electron detector is capable of operating in imaging and spectroscopy modes. The SEM is equipped with a user-friendly interface, simplifying specimen loading. It is capable of automated stages alignment, controlled by the integrated software tool. This automated alignment ensures your sample is in the correct position under the electron beam. Furthermore, the SEM is capable of computer-controlled operation, making it ideal for research laboratories. Overall, JEOL JEM 1200EX is an advanced SEM asset capable of superior imaging. Due its the ultra-high vacuum chamber, powerful detectors, and advanced control model, the SEM is versatile and capable of a wide range of applications. The sophisticated imaging equipment offers bright and dark field imaging modes with a resolution of 0.7 nm. Finally, with easy user interface, the SEM is a great choice for any research application.