Used JEOL JEM 1210 #149958 for sale
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ID: 149958
Vintage: 1994
Transmission electron microscope
Specifications:
For high contrast imaging at low to moderate magnifications (< 100,000x)
Used to image thin (< 200nm) samples of polymers and frozen hydrated solutions (surfactants,colloids, emulsions)
Maximum operating voltage: 120kV
Capable of imaging in high magnification (> 1,000x), low magnification, and diffraction modes
Minimum dose software
Free lens control
On-line measurement capabilities
Applications:
Conventional imaging and diffraction analysis
Cryo-transfer TEM of frozen hydrated specimens
Low-dose imaging of delicate specimens
Capabilities:
Accelerating voltage range 40-120 kV
Resolution 0.20 nm lattice, 0.36 nm point
Magnification from 50x to 800,000x
Graphical user interface with mouse control of most microscope functions
Film sheet type camera (can be upgraded to a digital camera system)
Includes:
Surrounding structure/desktop
Components to assemble system
Supporting documents, software disks, manual schematics
Tool Box and Manuals
Top Cl Lens
Flex Vacuum Lines
Penning Gauge Head
Pirani Tube, Top Vacuum Manifold
Film Receiving Boxes
Vibration Isolator Block and Air Line
Main Operation Video CRT Monitor
Main Gun lift Assembly
Keyboard
EM 21010 Single Tilt
Specimen Holder
Filaments
Spare Parts for ACD Heater
Extender PCB
Water Valve
Water Flow Meters
Misc. Parts
Assorted Cables
Film ING CRT
Cables and Binoculars
Air Compressor
HT Cable and Switch
Grounding Arm and Springs
Gun Lift Arm. Anode Chamber
Gun Ceramic
ACD Tank
Braided Copper
Anode Flexible Vacuum Line
Camera Adapter
Gun Chamber
Always under OEM service contract
De-installed by OEM and stored Q4 2006
1994 vintage.
JEOL JEM 1210 is a scanning electron microscope (SEM) designed and manufactured by JEOL Ltd. This SEM utilizes a field emission gun (FEG) cathode to achieve high-resolution imaging and high levels of magnification. JEM 1210 is capable of accelerating the electrons to an energy of 1.2 kV, with a maximum accelerating voltage of 10 kV. This EM features a 100 mm wide specimen stage with a zoom lens system that provides a magnification range of 10x to 100,000x. JEOL JEM 1210's electron optics provide excellent resolution and contrast, with a minimum of photon-generated noise and a low level of stray electrons resulting from the FEG cathode. The EM is equipped with a digital imaging interface which allows direct digital images, either full frame or Tile Scan mode, of the sample to be obtained, and these images can be analysed using dedicated software. JEM 1210 is equipped with a motorized stage that has a minimum step size of 8nm. This enables fine, microscopic adjustments when needed and enables imaging of very small specimens. It also features a Backscatter Detector (BSD) which provides secondary electrons signal to enhance imaging and detection of minute objects, as well as a Variable Pressure Detector which enables the instrument to photograph specimens in low vacuum if required. In addition to being suitable for routine tasks, JEOL JEM 1210 is also capable of performing Complex Multi-Probe Analysis, a method of gathering a wide range of information about a sample such as composition, element mapping, surface topography, texture, grain size and shape. Furthermore, it has the ability to detect a wide range of energies, from 4keV to 10keV, enabling analysis of a broad range of particles, including some which can't be seen with other SEM methods. For specimen preparation, JEM 1210 is supplied with two In-Situ specimen preparation holders, allowing for temperature controlled stages, both for heating and cooling, as well as in-situ deposition of materials. In addition, the state-of-the-art PC based software provides powerful image manipulation functions, including image composition, brightness and contrast control, particle analysis, histogram analysis and 3D imaging. Overall, JEOL JEM 1210 is a powerful and versatile tool that can be used for a wide range of applications by scientists and researchers. It offers a high level of magnification, excellent resolution and contrast, as well as an array of sample preparation and image manipulation features.
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