Used JEOL JEM 1210 #9204269 for sale

JEOL JEM 1210 is a scanning electron microscope (SEM) designed for both laboratory and industrial applications. The device features a large vacuum chamber and provides a magnification range from 10X to 30,000X. It utilizes a detector configured at 90° to the specimen, providing a 3D view of the sample. Additionally, the electron gun has a controllable energy range from 0.5 to 30 KeV, providing the ability to fine-tune the depth of the image. Incorporating a unique 'high angle' illumination spray, JEM 1210 offers improved beam current uniformity and better coverage for larger samples. The instrument also includes scanning functions such as 'Sub-Scan', which allows the user to magnify the image by a selected factor up to 30X, as well as 'Super-Scan' which can boost the imaging speed by up to 200 times compared to the standard scan speed. JEOL JEM 1210 is packed with a range of features designed to enhance the imaging properties. A dedicated 'Acceleration Field Correction' mode compensates for any distortion caused by magnetic fields in the vicinity of the specimen. The 'Electron Microanalysis' option enables quantitative analysis of the sample in addition to imaging. The unit also allows the user to collect X-Ray spectra from the sample, providing elemental information about the sample. JEM 1210 incorporates a variety of peripheral accessories for detection and analysis. The system includes a first-stage separator detector, second-stage scanning unit and digital imaging device, enabling rapid performance and superior results. The device also includes a searching unit and stage unit, which allows for precise scanning and manipulation of the sample. Additionally, JEOL JEM 1210 incorporates custom software for the automated control of the system and integrated control of various functions on the scan. With its wide range of advanced features, JEM 1210 provides users with a powerful tool for imaging and analyzing a variety of materials, ranging from atoms and molecules to semiconductors and nanostructures. This versatile SEM is an effective solution for comprehensive sample analysis and imaging.