Used JEOL JEM-1230 (HC) #9207453 for sale

JEOL JEM-1230 (HC) is an advanced high-resolution scanning electron microscope (SEM) offering superior imaging and analytical capabilities with a high contrast image and high depth of field. This is achieved through the use of a high voltage electron gun, a raster scan type, and a reprocessing equipment which enable high precision operations. This system also offers a wide range of imaging modes and sample manipulation capabilities with a built-in command console. The unit derives its powerful image analytical capabilities from its impressive range of sample manipulation tools, including an adjustable horizontal tilt, a rotary sample stage, and an auto-focus machine. The built-in command control console is tailored to reduce user error, allowing users to easily enter parameters and interact with the microscope's systems. The high-quality imaging and data analysis capability of the microscope can be further enhanced with the included energy-filtering detector (EFD) tool, which allows for light element analysis and allows users to remove undesired signals from the image. The EFD asset also adds further contrast and detail to the images. JEOL JEM-1230 (HC) supports a wide range of imaging techniques, from contrast enhancement to with multi-staged contrast to nano-scale imaging. With the advanced contrast techniques, you can obtain powerful imaging and data analysis. With its improved performance, JEOL JEM-1230 (HC) can produce results without the need for conventional scanning electron sources. In addition, JEOL JEM-1230 (HC) provides an intuitive user interface that allows users to operate the microscope smoothly and accurately. A comprehensive suite of automated tools has been developed to minimize time and effort while maximizing high-quality results. Overall, JEOL JEM-1230 (HC) is an advanced high-resolution scanning electron microscope (SEM) offering superior imaging and analytical capabilities thanks to its impressive range of features, including its adjustable horizontal tilt, its rotary sample stage, its auto-focus model, and its energy-filtering detector (EFD) equipment. With its intuitive user interface, its automated tools, and its cutting-edge imaging capabilities, users of JEOL JEM-1230 (HC) can expect to obtain powerful images and data analysis with minimal effort.