Used JEOL JEM 1230 #9208907 for sale

JEOL JEM 1230 is a scanning electron microscope (SEM) designed for imaging a wide range of challenging samples. This high-resolution premium microscope features a large Field of View (FoV) and an electron gun with a longer barrel for a larger depth of focus during imaging. It is also equipped with a high-resolution column for maximum resolution and detail. JEM 1230 is encased in an acoustic and vibration isolation cabinet, making it ideal for even the most sensitive nanoscale imaging. At the heart of JEOL JEM 1230 is its advanced SEM technology. The gun produces an electron beam that is focused onto the sample to generate a scanning image. The powerful gun and column set up allow the microscope to acquire images at high speeds while achieving resolutions as low as 0.2 nm. This makes it suitable for a variety of applications, such as exploring materials, measuring specimen characteristics, and studying particle behavior. Alongside JEM 1230's advanced imaging capabilities, it also includes an array of advanced features for enhanced imaging and analysis. For instance, its low beam current technology and a host of sample manipulation methods allow for better imaging of even the most intricate samples. Furthermore, a built-in image stitching feature lets you easily generate larger images of your specimens. JEOL JEM 1230 also offers WDS and ED-FEG Elemental Analysis and compositional analysis tools. This makes the microscope capable of providing elemental maps of specimens, showing the distribution and concentration of elements present. JEM 1230 is engineered to be reliable and easy to use. The ergonomic design allows users to access all areas of the microscope quickly and easily, while the intuitive user interface gives users access to a range of imaging, analysis and acquisition functions. This makes it an ideal choice for use in a wide range of research and industrial applications.