Used JEOL JEM 1230 #9226959 for sale
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ID: 9226959
Vintage: 2005
Transmission electron microscope (TEM)
Digitized microscope controlled by microprocessor
Motorized 5-axis object stage
Active matrix color monitor (TFT)
Interactive control of operating parameters by mouse / Console
Backup of operating parameters and control
Programmable personal files
Standard RS 232 C connections
Guaranteed resolution: 0.20 nm in periodic system
Acceleration voltage:
40 to 120 kV
Plot minimum: 50 V
Programmable
Magnification range:
50 x 1000 x (Low MAG function)
1000 x 600,000 x (MAG function)
Object tilt: +/- 45°
2005 vintage.
JEOL JEM 1230 is a high performance scanning electron microscope (SEM). It provides an advanced level of resolution and image quality that can be used in diverse scientific and industrial imaging applications. The all-in-one equipment features a quartz monochromator as well as a high resolution electron optical lens, and an ultra-fast scanning speed. It has a wide range of scan magnifications with 20X to 1,000,000X, allowing for detailed analyses of a wide variety of samples. This SEM also has a built-in microanalysis system which can be used to obtain elemental information such as oxygen, carbon, and sulfur. It has a maximum acceleration voltage of 30 kV which allows for a higher resolution and low beam currents to reduce sample damage. The sophisticated software package allows for intuitive and easy user control of the instrument. This includes setting data acquisition parameters, controlling the scan speed, and controlling image enhancement. The software also features image-editing and image-analysis capabilities, as well as 3D image mapping, which can be used for detailed analyses. JEM 1230 is a versatile and reliable tool that provides high resolution imaging in a wide range of applications, such as nanotechnology and materials science. It is equipped with a sophisticated thread detector which allows for rapid image acquisition for semi-automated systems, such as those used in sub-micron imaging. Additionally, the SEM contains a digital camera to enable direct observation with an eyepiece. Overall, JEOL JEM 1230 is an advanced and highly reliable SEM with an excellent image quality. It offers excellent resolution and the ability to provide detailed analyses of a variety of samples, as well as a user-friendly interface that makes it easy to use and control the instrument. Furthermore, the built-in analytical unit and 3D image mapping capabilities give operators the ability to obtain detailed insight into a sample's characteristics. The machine is ideal for a range of applications and provides invaluable support to industry and research.
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