Used JEOL JEM 1230 #9245614 for sale

JEOL JEM 1230 is a state-of-the-art scanning electron microscope (SEM) designed for high-resolution imaging and analysis of specimens. With an Energy Dispersive X-ray Spectrometer (EDS) and an ultra-high-resolution STEM detector, the instrument provides outstanding performance for a variety of applications, such as microstructural evaluation of materials, failure analysis, space material science, and material evaluation. JEM 1230 offers a superior resolution of up to 5 nm under optimum conditions. This allows for imaging of fine details that can help to characterize a sample's composition, structure, and morphology. The microscope uses an inverted 180° tilting geometry which ensures that the specimen is imaged from the top down. This offers the advantage of characterizing large samples efficiently and without the need for frequent repositioning. JEOL JEM 1230 employs a Schottky Field Emission Gun (FEG) with high brightness, long lifetime, and low operating costs. This cutting-edge design minimizes charging of non-conductive specimens and allows for excellent contrast of the sample image. Moreover, the microscope has an acceleration voltage of up to 135 kV for greater depth of field and higher resolution. To ensure high-precision analysis and consistent results, various automated functions are integrated. These include the automated optimization of image contrast, an integrated fiducial system, and a live digital image enhancement. Furthermore, the instrument has a motorized stage for specimen loading and positioning, as well as an advanced filtering system which permits the characterization of particles down to 1 nm. or JEM 1230 is a high-performance scanning electron microscope with superior resolution and a robust feature-set for imaging and analysis of a variety of samples. The instrument has a Schottky Field Emission Gun (FEG) with high brightness and low operating costs, an inverted 180° tilting geometry which ensures efficient imaging of large samples, and an acceleration voltage of up to 135 kV for enhanced image quality. For precise specimen analysis and characterization, JEOL JEM 1230 integrates an Energy Dispersive X-ray Spectrometer (EDS) and an ultra-high-resolution STEM detector. In addition, several automated functions, such as automated optimization of image contrast and automated optimizations of particle size, make analyzing specimens easier and faster. These features, combined with a motorized stage and a live digital image enhancement, make JEM 1230 an excellent choice for microstructural evaluation of materials, failure analysis, space material science, and material evaluation.