Used JEOL JEM 1230 #9248904 for sale

JEOL JEM 1230 is a high-performance scanning electron microscope (SEM) designed with the latest imaging technology. Its ergonomic design features a large tilt range, a large motorized stage, and a wide chamber option for increased flexibility. JEM 1230 is capable of scanning specimens up to 250 x 250 mm in size and offers a magnification range of up to 250,000x. This allows for the observation of surface topology, local differential phase contrast, and image sectioning. JEOL JEM 1230 is a low vacuum SEM with an Oil Free Diaphragm pump that requires minimal attendee for maintenance, ultimately extending its lifetime. It also has an integrated gas injector system for the introduction of secondary electrons that aid in the detection of improvements and characteristics at a much faster rate. JEM 1230 also features a wide array of detectors including a variable pressure detector, a secondary electron detector, and a backscatter electron detector, each designed to capture various elements of a sample. The variable pressure detector is designed to improve surface sensitivity and is capable of toggling between 1Pa~15Pa. In addition, the secondary electron detector is capable of selectable image formation that can be used to observe specimen topology along with an apparent thickness and an apparent roughness. The backscatter detector is designed to acquire the shape of a sample surface and capture various features at any given magnification. JEOL JEM 1230 is further equipped with a multi-mode digital camera system that is capable of capturing multiple images from specimens then stitching them together for superior clarity and detail. The Sem enables rapid image acquisition and flexible EDX (Energy dispersive X-ray) measurements for up to four independent detectors. Operation of the system is nearly effortless with a highly durable user interface capable of providing seamless data a nalyses, software compatibility and remote operation. Moreover, JEM 1230 is perfect for industrial inspection and research applications, offering a high resolution imaging of a variety of materials. The state of the art imaging technology employed by this SEM provide unparalleled flexibility and accuracy, ushering in a new era of SPM performance.