Used JEOL JEM 1230 #9390890 for sale
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ID: 9390890
Scanning Transmission Electron Microscope (STEM)
With UTW EDS system
Computer non-functional.
JEOL JEM 1230 is a scanning electron microscope (SEM) that enables the user to have high-resolution imaging capabilities with a wide range of features. This microscope is capable of providing a large number of analytical techniques that range from making measurements of microstructures and particles to elemental distribution mapping. Its more advanced capabilities include high-resolution imaging and analysis of non-uniform materials and objects. The basic components of JEM 1230 include a liquid-nitrogen cooled crystal-cathode electron gun, a high-vacuum chamber, a scan generator, and a high resolution monitor. The crystal-cathode electron gun is used to produce the electrons that are sent to the sample. The high-vacuum chamber is what helps keep the entire system free from any stray electrons, thus allowing the imaging and analysis to be performed in a clean environment. The scan generator is used to control and regulate the electron beam, allowing the user to adjust the magnification and imaging parameters. The high resolution monitor displays the results in clear and highly detailed images. JEOL JEM 1230's resolutions can reach up to a very high 5 nm for imaging and 20 nm for analysis. This high resolution enables users to see microscopic features in a level of detail never before seen. Additionally, JEM 1230 is able to analyze a wide variety of different samples. This includes samples that are solid, liquid, or even gas. The microscope is also able to analyze materials in all stages of assembly, such as those in varying thicknesses, shapes, and sizes. JEOL JEM 1230 also comes with a variety of software packages to help users with analyzing their sample. These packages range from automation tools to graph plotting and data analysis programs. The data analysis tools allow users to have greater insight into the structure of the sample they're analyzing. Plus, the user interface is highly intuitive, making it easier for scientists to quickly learn and utilize the software. These features combined with its ease-of-use and versatility makes JEM 1230 a must-have tool for any scanning electron microscope user. With its wide range of capabilities and applications, JEOL JEM 1230 is able to help scientists find answers to their most complex questions.
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