Used JEOL JEM 1230 #9395151 for sale

JEOL JEM 1230 is a scanning electron microscope (SEM) that is utilized for imaging and chemical analysis. JEM 1230 is composed of a number of components including an electron source, an electron deflector, an electron detector, and a specimen holder. The electron source is a thermionic emission source and produces an electron beam which is then collimated to produce a focused beam. JEOL JEM 1230 has a high stability electron source with a filament oxidation protection system that ensures high stability and a long filament life. The electron deflector is used to scan the electron beam over the sample surface. It is comprised of two subsystems, a deflector unit and a scanning system. The deflector unit deflects the electron beam to cover the entire specimen surface and the scanning system moves the specimen stage relative to the electron beam in both X and Y directions. The electron detector is used to detect the secondary electrons emitted from the sample surface. Depending on the application and sample, the detector can be custom configured to provide topographical or elemental analysis images. As well, the detector can be equipped with a digital camera for enhanced resolution and contrast. The specimen holder is designed to securely hold the specimen in the SEM vacuum chamber. Depending on the application requirements, the sample holders can be configured for macro or micro applications, as well as cryo applications. Overall, JEM 1230 is a high performance SEM designed to provide high resolution and contrast imaging and chemical analysis. With its stable electron source, its high performance deflector and detector systems, and compatible specimen holders, JEOL JEM 1230 can provide valuable insights into specimen composition and structure.