Used JEOL JEM 1400 Plus #9128122 for sale

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ID: 9128122
Vintage: 2015
Transmission electron microscope (TEM) 2015 vintage.
JEOL JEM 1400 Plus is a scanning electron microscope (SEM) designed for precision imaging and analytical measurements of surface materials and features of solid samples. This high-performance instrument offers a wealth of functionality and features that enable detailed analysis, including an improved orticon, improved resolution, high vacuum operations, an ultra-high-speed scanning system, and a wide range of instruments for sample analysis. With its high-contrast images, JEOL JEM 1400PLUS provides superior images that are capable of displaying thin layers of atoms and single particles. The instrument's New Focus ultra-high display is ideally suited for displaying detailed images even at high magnifications. Its high vacuum operations ensure that high resolution images are produced with minimal sample deterioration. In addition, the New Focus scanning system is ideal for capturing data over a small area with high accuracy. With its advanced orticon, the instrument is capable of producing detail even at the highest magnifications. JEM-1400PLUS includes a wide range of instrument features and capabilities that can be tailored to the user's needs. Its High Q/Low Q modes enable the user to adjust contrast, brightness, and TV gain to produce high-contrast and low-contrast images. Its advanced scanning features enable users to accurately collect data over larger areas and to display multiple frames on the same screen. The instrument is further equipped with a wide range of electron and X-ray detectors for imaging and analysis purposes. JEOL JEM-1400PLUS is ideal for a variety of research and applications. Its superior imaging capabilities wcan be used to study nanostructures in materials science and biology, and its analytical capabilities facilitate the study of physical and chemical properties of surface materials. The instrument's high vacuum operation also ensures that it can be used to examine samples for aerospace and semiconductor applications. In addition, its advanced energy filters enable the user to study the chemical composition of the sample.
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