Used JEOL JEM 1400 Plus #9238369 for sale

JEOL JEM 1400 Plus is a field emission scanning electron microscope (FESEM) used for imaging and microanalysis. It employs a cold field emission gun, providing high brightness and low beam current resulting in high resolution imaging with clear, crisp images. The microscope has an accelerating voltage of 5-30kV, which contributes to the resolution and allows for the determination of crystalline structures and phase components of various materials. An in-lens detector can also be used to acquire better sample information with less beam damage. The integrated beam deceleration allows for gentle sample interaction which enables high-resolution SE1 imaging and ultra-high resolution imaging results. The integrated in-lens detector enables fast and precise auto-focusing of the microscope, making it perfect for 3D topography imaging. The high extraction voltage also gives it a large depth of focus, making it suitable for imaging large, curved surfaces. In addition to imaging, JEOL JEM 1400PLUS is also equipped with various analytical capabilities. It has Energy-dispersive X-ray spectroscopy (EDX) and electron backscatter diffraction (EBSD) detectors which can be used to obtain elemental distribution, as well as the crystal information of the examined material. Additionally, secondary and backscattered electron images/detector can also be used to observe the surface structure of the sample. JEM-1400PLUS is versatile, cost-effective, and easy to use with a high-resolution performance for all applications. It is an ideal tool for research institutes and industrial laboratories looking for a scanning electron microscope with advanced analytical capabilities.