Used JEOL JEM 1400 Plus #9304360 for sale

JEOL JEM 1400 Plus is an analytical scanning electron microscopy (SEM) instrument designed for high resolution imaging, elemental analysis and for the precise quantitation of material morphology. With its large depth-of-field, superior imaging capabilities, and its advanced automated features, this instrument has a variety of applications across multiple disciplines. JEOL JEM 1400PLUS includes both variable pressure and variable pressure (ESEM) modes providing the user with the versatility to image samples without requiring chemical amendments or vacuum deposition. The system includes a LaB 6 filament electron gun to produce a stable 5.0 kV electron beam with a spot size below 3 nanometers. State-of-the-art automated features for positioning, focusing, and stigmation make operating JEM-1400PLUS quick and simple. JEM 1400PLUS has a special articulated column that allows the sample stage to move within the field of view displaying larger samples than what can be contained in its field of view. This feature makes sample imaging more efficient, especially when needing to capture multiple images at different magnifications. Image resolution is further enhanced by the inclusion of a chromatic aberration corrector which minimizes distortions and image blur due to chromatic aberration. JEOL JEM-1400PLUS offers an array of detection systems to provide the user with information about sample features. This includes a semi-automatic energy-dispersive x-ray spectroscopy (EDS) system, which produces high-resolution energy dispersions spectra for qualitative analysis and compositional information of the sample. The EBSD detector in the 1400 Plus is especially designed to provide the user with crystal orientation mapping for crystalline and nanocrystalline materials. The Single Point Analysis Mode (SPAM) of JEM 1400 Plus allows users to collect multiple analytical maps from a single area with automatic reconfigurations of the beam based on the users pre-specified specifications. Finally, the integrated cathodoluminescence detector can be used auto-generate a variety of maps such as chemical composition and polarization maps. At the high end of the electron microscopy field, JEOL JEM 1400 Plus is a powerful analytical tool with its unmatched imaging, elemental analysis and morphological quantification capabilities.