Used JEOL JEM 1400 #293752726 for sale
URL successfully copied!
Tap to zoom
ID: 293752726
Transmission Electron Microscope (TEM)
GATAN Orius SC1000 / SC600
GATAN UltraScan 4000
Single specimen holder: ±26°
High tilt specimen holder: ±70°
Orius fastscan digital camera
GATAN Ultrascan high-resolution digital camera
Magnification range: 50x and 1,200,000x
Power supply: 120 keV.
JEOL JEM 1400 is a sophisticated scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples in various scientific and industrial applications. This advanced instrument combines cutting-edge technology with user-friendly features to provide researchers, scientists, and engineers with powerful tools for visualizing and characterizing materials at the micro- and nano-scale. At the heart of JEM 1400 is an electron column that generates a focused beam of high-energy electrons to interact with the sample surface. The SEM utilizes electron-optical systems, including electromagnetic lenses and apertures, to manipulate and control the electron beam for precise imaging and analysis. The electron beam scans across the sample surface in a raster pattern, generating signals that are detected and processed to form detailed images with exceptional resolution and contrast. With a maximum accelerating voltage of up to 120 kV, JEOL JEM 1400 can achieve high magnification levels, allowing users to visualize samples with sub-micron and even nanometer-scale resolution. This capability is essential for examining fine surface structures, particles, and features that are beyond the reach of conventional optical microscopes. The instrument's high-resolution imaging performance is complemented by advanced signal detection systems, such as secondary electron (SE) and backscattered electron (BSE) detectors, which capture different types of electron signals emitted from the sample. JEM 1400 features a range of imaging modes and techniques to suit diverse research needs. In addition to standard imaging modes like SE and BSE imaging, the microscope offers advanced capabilities such as energy-dispersive X-ray spectroscopy (EDS) for elemental analysis, electron backscatter diffraction (EBSD) for crystallographic mapping, and cathodoluminescence (CL) for studying luminescent properties. These techniques enable researchers to obtain valuable information about sample composition, structure, and properties at the micro- and nano-scale. Moreover, JEOL JEM 1400 is equipped with innovative automation and software features to enhance user efficiency and productivity. The microscope's intuitive user interface allows for easy control of imaging parameters, specimen navigation, and data acquisition. Automated routines for focusing, stigmation, and beam alignment streamline experimental workflows and ensure reproducibility in imaging results. Additionally, powerful image processing and analysis software tools enable users to extract quantitative data, perform particle analysis, and create detailed visualizations of their samples. JEM 1400 is a versatile and reliable instrument that meets the demands of modern research laboratories, academic institutions, and industrial facilities. Its robust design, excellent imaging performance, and advanced analytical capabilities make it an indispensable tool for a wide range of applications, including materials science, nanotechnology, geoscience, biological research, and semiconductor analysis. Whether investigating microstructures, surface properties, or chemical compositions, this SEM offers high-quality imaging and analysis solutions that drive scientific discovery and technological innovation.
There are no reviews yet