Used JEOL JEM 1400 #9199923 for sale

JEOL JEM 1400 is a scanning electron microscope (SEM) with an integrated energy dispersive X-ray analyzer (EDS). This is an invaluable tool for analytical and materials science research, allowing for the visualization and analysis of microstructures to sub-micron levels of detail. It features a very stable and precise automated control system, as well as excellent analytical capabilities. A variety of SEM modes are available, including low-vacuum, variable-pressure for in-situ observations, and cryo-SEM for examining frozen Hydrated samples. The instrument also includes an automated stage for positioning samples and an automation interface for loading/unloading samples, sample-to-sample transfers, and operation by remote software such as Scanning ion microscopy (SIM) or Secondary electron autoportrait (SEAP). The operating voltage range of JEM 1400 is from 0.5kV to 30kV, and it has a resolution of 2azim (angular). Its lateral and vertical resolution capabilities are 0.7nm at 1kV, and 0.6nm at 30kV. It is also equipped with an in-column energy filter, giving it improved energy filtering capability for less interference at higher voltages. JEOL JEM 1400 also includes features such as electron beam stigmas, digital signal processing, Automatic Exposure Protocol capability, multiple sample transfer, and an upgraded image processing system. The detector array is high sensitivity and includes both secondary and backscattered electron detectors. The secondary electron detector has a large field of view, allowing for faster imaging at larger magnifications. For automated measurements, JEM 1400 includes a suite of metrology software to facilitate automated area and linear measurements across multiple axes, as well as automatic elemental composition analysis with the integrated EDS. The same automation capabilities can be used for the acquisition of secondary and backscattered electron elements and compositional maps, making it ideal for targeted analysis. Overall, JEOL JEM 1400 is an incredibly versatile and powerful scanning electron microscope, suitable for a wide variety of analytical and metrology applications to micro and nanostructures. Its efficient automation capabilities, precision control system, and ability to capture and analyze diverse samples make it an invaluable tool in the field of mater science for those looking for highly advanced capabilities.