Used JEOL JEM 2000EX MKII #9096281 for sale

JEOL JEM 2000EX MKII
ID: 9096281
Transmission Electron Microscope (TEM).
JEOL JEM 2000EX MKII is a scanning electron microscope (SEM) that combines high resolution imaging capabilities with a variety of environmental capabilities. It can analyze samples in air, including those with low vacuum requirements, fluids, and temperatures from -196°C to 500°C. It has a deflection angle of +/- 90° and a spot size of 5nm - allowing for a wide range of sample analysis requirements. Its field of view ranges from 2.2 - 1000nm depending on the beam current setting. JEM 2000EX MKII also features an electron gun that provides excellent stability and enhanced performance, a unique island column offering low vibration operation, a high stability 4-magnet objective lens, and a nano-scale analysis equipment. Its modular design incorporates a chromatic objective lens correction system, a vacuum chamber, and a digital interface. The nano-scale analysis unit offers resolution and pixel size that create crisp, brilliant images with excellent contrast. The Super High Resolution Detector Machine provides ultra-high resolution images with up to 1 nm resolution. It also contains an in-column secondary electron detector, a solid state detector tool, and a backscattered electron detector for imaging on any sample size ranging from ions to large structures. JEOL JEM 2000EX MKII is powered by the Celscan Pro operating asset, which allows the user to access, store and analyze data quickly and easily. This operating model offers automated scanning and data acquisition, extended image processing and image manipulation capabilities, and advanced calibration functions. The multiple dedicated application software provides image acquisition, image processing and analysis tools, perfect for performing any kind of sample analysis. JEM 2000EX MKII is built to provide maximum ease of use, allowing the user to focus on the scientific results. In conclusion, JEOL JEM 2000EX MKII is an advanced and powerful scanning electron microscope, and is ideal for any application requiring high resolution, multiple environmental capabilities and robust operation. Its versatility and versatility feature set make it a great choice for a wide range of laboratory and research applications.
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