Used JEOL JEM 2000FX II #293636585 for sale

JEOL JEM 2000FX II is a high-performance, scanning electron microscope (SEM) for conducting advanced research in the fields of nano-structured materials, bio-medical engineering and material science. It provides resolution close to the atomic scale and helps to visualize the microstructure of both crystalline and non-crystalline materials. It has a unique configuration that supports automated observation capabilities in combination with a high-angle in-lens secondary electron (SE) detector and a computer-controlled sample stage. The in-lens SE detector allows for low magnification imaging and imaging with the highest resolution of 1.7 nm (at a 20 kV accelerating voltage). This detector also enables imaging of non-conducting materials. JEM 2000FX II has an overall magnification of 3,000 - 400,000 X, utilizing a high power 120 kV field emission gun with a monochromator providing a long working distance objective lens. The sample stage can be motorized to allow automated mapping of specimens over large areas. With automated stage mapping, the same area of a specimen can be scanned multiple times to generate a higher-resolution image. SEM Control software is included to simplify manual operation. JEOL JEM 2000FX II is an intuitive and user-friendly system for imaging and surface analysis. The visualization of images can be converted to digital formats for further analysis and improved quality of images. Extended imaging options include bright field, dark field, false color, polarized light and 3D imaging. Several acquisition modes are supported for optimal imaging, such as high-speed, large area and single-frame acquisitions modes. The microscope is also equipped with automated equipment for EDX and XRF analysis. This allows for chemical and elemental analysis of specimens by detecting electromagnetic radiation from products of interactions between the specimen and beam. Additionally, the low vacuum imaging mode supports all these analysis operations while minimizing the adverse effects of ion scattering and interference patterns. To ensure ease-of-use, JEM 2000FX II is designed with a single microscope column and the all-in-one detector with six detectors that can be combined in one unit or mounted separately. It has an ergonomic design, with a PC-controlled graphical user interface, which is powered by an externally mounted PC. With an intuitive workflow and an operation-friendly design, it can help boost research productivity.