Used JEOL JEM 2000FX #9265721 for sale

JEOL JEM 2000FX is a field emission type scanning electron microscope (SEM) designed to provide high resolution imaging, as well as analysis capabilities. The powerful performance of JEM 2000FX have made it one of the most popular and reliable scanning electron microscopes available. JEOL JEM 2000FX features an increased magnification range up to 1.2 million times and an effective magnification of 1000X, allowing users to view specimens at a very high level of detail. This microscope also comes with an automated stigmator equipment, which allows users to quickly and accurately adjust the position of the electron gun, as well as the objective aperture. JEM 2000FX comes with a range of imaging and analysis capabilities, including backscattered electron imaging and spectroscopy, source-selected secondary electrons imaging, annular dark field imaging, and X-ray spectrometry. The microscope is equipped with an energy filtering system which can be used to effectively reject incoming electrons while simultaneously allowing high energy electrons to pass through. This allows users to perform a wide variety of analyses, such as chemical and elemental mapping, phase analysis, strain measurement, and spectroscopy. In addition, JEOL JEM 2000FX is also equipped with an advanced electron optical unit, which includes a field emission gun and two multi-aperture condenser lenses. This machine significantly reduces chromatic aberration and electrical distortions, offering images with superb resolution and contrast. The microscope also includes a two-electron gun tool which allows for simulataneous imaging and analysis of two different regions using two different gun positions. JEM 2000FX is also easy to operate, with a fully integrated user interface featuring touch screen control and data handling capabilities. This makes it simple for users to quickly and efficiently acquire SEM images, analyze the data, and process it for future applications. The microscope comes with an automated sample mount asset which allows users to quickly and easily load and analyze specimens. Overall, JEOL JEM 2000FX is a powerful and reliable tool designed to provide users with the highest level of imaging, as well as a wide range of analysis capabilities. This advanced scanning electron microscope is ideal for researchers looking to achieve the highest levels of resolution and accuracy.